Electrical Performance Monitoring System for Semiconductor Reliability Research

Overview

Medical Equipment & Lab Supplies

Gaithersburg, Maryland, United StatesPosted 27 days agoDeadline: April 24th, 2026

Fit Score

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SUMMARY

RFI for a system to monitor electrical performance and provide time-resolved data for advanced semiconductor packaging reliability research.

KEY REQUIREMENTS

Must be a new system, not used or remanufactured
Must meet all technical specifications including 3-slot chassis, 3 channels, and specific electrical ranges
Must be registered and active in SAM.gov at the time of solicitation response
Must provide a minimum 12-month warranty
Must comply with cybersecurity and privacy requirements including FIPS 140-2/140-3 validation
Must provide all original documentation and software

BUDGET

Estimate

$50,000 – $150,000

TIMELINE

Response date: April 24th, 2026

Delivery: No later than 20 weeks after receipt of order.

QUESTION DEADLINE

April 19th, 2026

Issuing Agency

National Institute Of Standards And Technology

Organization overview and procurement intelligence available on paid plans.

See Issuer Research

DESCRIPTION

The client is seeking information regarding an electrical performance monitoring system to support time–resolved data generation for populating an open-source physical property database. This system is a critical component of a CHIPS project that centers on the reliability of advanced packaging in heterogeneously integrated semiconductor devices.

Requirements for the solution include support for multiuser software environments, EIS (Electrochemical Impedance Spectroscopy) testing and fitting capabilities, as well as the preferred ability to integrate external data loggers and temperature monitoring systems, with support for incorporating integrated file data. The solution will underpin research and reliability assessment activities for advanced semiconductor device packaging.

Source attribution

This Settle analysis is based on the issuing organization’s public RFP listing.